Effect of oxygen partial pressure on the dielectric properties and microstructures of cofired base-metal-electrode multilayer ceramic capacitors
Identifieur interne : 001568 ( Main/Exploration ); précédent : 001567; suivant : 001569Effect of oxygen partial pressure on the dielectric properties and microstructures of cofired base-metal-electrode multilayer ceramic capacitors
Auteurs : QIQUAN FENG [États-Unis] ; Caspar J. Mcconville [États-Unis] ; Doreen D. Edwards [États-Unis] ; Daniel E. Mccauley [États-Unis] ; Mike Chu [États-Unis]Source :
- Journal of the American Ceramic Society [ 0002-7820 ] ; 2006.
Descripteurs français
- Pascal (Inist)
- Etude expérimentale, Céramique oxyde, Céramique électronique, Baryum titanate, Condensateur céramique, Condensateur électrochimique, Multicouche, Effet pression, Pression partielle, Pression oxygène, Propriété électrique, Propriété diélectrique, Microstructure, Relation fabrication propriété, Microscopie électronique transmission, Spectrométrie RX, Spectrométrie dispersive, BaTiO3, Ba O Ti, 8247U.
English descriptors
- KwdEn :
- Barium titanates, Ceramic capacitor, Dielectric properties, Dispersive spectrometry, Electrical properties, Electroceramics, Electrolytic capacitor, Experimental study, Fabrication property relation, Microstructure, Multiple layer, Oxide ceramics, Oxygen pressure, Partial pressure, Pressure effect, Transmission electron microscopy, X ray spectrometry.
Abstract
The dielectric properties, dopant distributions, and microstructures of BaTiO3-based multilayer ceramic capacitors (MLCCs) sintered in H2N2-H2O atmospheres with Po2 = 10 7.5 Pa (BMX-7.5) and Po2 = 10-9.5 Pa (BMX-9.5) were studied, and the effects of oxygen partial pressures were analyzed. Dielectric measurements showed that BMX-7.5 had a lower dielectric constant at temperatures above 20 C, but a higher dielectric constant at temperatures below 10°C when compared with BMX-9.5. The coexistence of core-shell and core grains was observed in bright field (BF) transmission electron microscopy images in both types of capacitors. Triple-point and grain boundary phases were observed more frequently in BMX-9.5 than in BMX-7.5, and energy-dispersive X-ray spectrometer point-by-point analysis revealed that these second phases contained high concentrations of dopants such as Si, Y, and Ca. The dopant concentration in the shell regions in BMX-7.5 was higher than that in similar regions in BMX-9.5. Smeared and twisted grain boundaries with fringes observed in both types of MLCCs indicated that the shell regions in both samples were formed either by diffusion of foreign ions into BaTiO3 or by crystallization of grain boundary and triple-point liquid phases. It was deduced that the partial pressure of oxygen in the sintering atmosphere influenced the microstructures, dopant distributions, and core-shell ratios of the grains in these materials.
Affiliations:
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Effect of oxygen partial pressure on the dielectric properties and microstructures of cofired base-metal-electrode multilayer ceramic capacitors</title><author><name sortKey="Qiquan Feng" sort="Qiquan Feng" uniqKey="Qiquan Feng" last="Qiquan Feng">QIQUAN FENG</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>The New York State College of Ceramics at Alfred University</s1><s2>Alfred, New York 14802</s2><s3>USA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>The New York State College of Ceramics at Alfred University</wicri:noRegion></affiliation></author><author><name sortKey="Mcconville, Caspar J" sort="Mcconville, Caspar J" uniqKey="Mcconville C" first="Caspar J." last="Mcconville">Caspar J. Mcconville</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>The New York State College of Ceramics at Alfred University</s1><s2>Alfred, New York 14802</s2><s3>USA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>The New York State College of Ceramics at Alfred University</wicri:noRegion></affiliation></author><author><name sortKey="Edwards, Doreen D" sort="Edwards, Doreen D" uniqKey="Edwards D" first="Doreen D." last="Edwards">Doreen D. Edwards</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>The New York State College of Ceramics at Alfred University</s1><s2>Alfred, New York 14802</s2><s3>USA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>The New York State College of Ceramics at Alfred University</wicri:noRegion></affiliation></author><author><name sortKey="Mccauley, Daniel E" sort="Mccauley, Daniel E" uniqKey="Mccauley D" first="Daniel E." last="Mccauley">Daniel E. Mccauley</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Ferro Electronic Material Systems. Ferro Corporation</s1><s2>Penn Yan, New York 14527</s2><s3>USA</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>Ferro Electronic Material Systems. Ferro Corporation</wicri:noRegion></affiliation></author><author><name sortKey="Chu, Mike" sort="Chu, Mike" uniqKey="Chu M" first="Mike" last="Chu">Mike Chu</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Ferro Electronic Material Systems. Ferro Corporation</s1><s2>Penn Yan, New York 14527</s2><s3>USA</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>Ferro Electronic Material Systems. Ferro Corporation</wicri:noRegion></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">INIST</idno><idno type="inist">06-0443658</idno><date when="2006">2006</date><idno type="stanalyst">PASCAL 06-0443658 INIST</idno><idno type="RBID">Pascal:06-0443658</idno><idno type="wicri:Area/PascalFrancis/Corpus">000043</idno><idno type="wicri:Area/PascalFrancis/Curation">000031</idno><idno type="wicri:Area/PascalFrancis/Checkpoint">000045</idno><idno type="wicri:explorRef" wicri:stream="PascalFrancis" wicri:step="Checkpoint">000045</idno><idno type="wicri:doubleKey">0002-7820:2006:Qiquan Feng:effect:of:oxygen</idno><idno type="wicri:Area/Main/Merge">001594</idno><idno type="wicri:Area/Main/Curation">001568</idno><idno type="wicri:Area/Main/Exploration">001568</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Effect of oxygen partial pressure on the dielectric properties and microstructures of cofired base-metal-electrode multilayer ceramic capacitors</title><author><name sortKey="Qiquan Feng" sort="Qiquan Feng" uniqKey="Qiquan Feng" last="Qiquan Feng">QIQUAN FENG</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>The New York State College of Ceramics at Alfred University</s1><s2>Alfred, New York 14802</s2><s3>USA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>The New York State College of Ceramics at Alfred University</wicri:noRegion></affiliation></author><author><name sortKey="Mcconville, Caspar J" sort="Mcconville, Caspar J" uniqKey="Mcconville C" first="Caspar J." last="Mcconville">Caspar J. Mcconville</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>The New York State College of Ceramics at Alfred University</s1><s2>Alfred, New York 14802</s2><s3>USA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>The New York State College of Ceramics at Alfred University</wicri:noRegion></affiliation></author><author><name sortKey="Edwards, Doreen D" sort="Edwards, Doreen D" uniqKey="Edwards D" first="Doreen D." last="Edwards">Doreen D. Edwards</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>The New York State College of Ceramics at Alfred University</s1><s2>Alfred, New York 14802</s2><s3>USA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>The New York State College of Ceramics at Alfred University</wicri:noRegion></affiliation></author><author><name sortKey="Mccauley, Daniel E" sort="Mccauley, Daniel E" uniqKey="Mccauley D" first="Daniel E." last="Mccauley">Daniel E. Mccauley</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Ferro Electronic Material Systems. Ferro Corporation</s1><s2>Penn Yan, New York 14527</s2><s3>USA</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>Ferro Electronic Material Systems. Ferro Corporation</wicri:noRegion></affiliation></author><author><name sortKey="Chu, Mike" sort="Chu, Mike" uniqKey="Chu M" first="Mike" last="Chu">Mike Chu</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Ferro Electronic Material Systems. Ferro Corporation</s1><s2>Penn Yan, New York 14527</s2><s3>USA</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>États-Unis</country><wicri:noRegion>Ferro Electronic Material Systems. Ferro Corporation</wicri:noRegion></affiliation></author></analytic><series><title level="j" type="main">Journal of the American Ceramic Society</title><title level="j" type="abbreviated">J. Am. Ceram. Soc.</title><idno type="ISSN">0002-7820</idno><imprint><date when="2006">2006</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Journal of the American Ceramic Society</title><title level="j" type="abbreviated">J. Am. Ceram. Soc.</title><idno type="ISSN">0002-7820</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Barium titanates</term><term>Ceramic capacitor</term><term>Dielectric properties</term><term>Dispersive spectrometry</term><term>Electrical properties</term><term>Electroceramics</term><term>Electrolytic capacitor</term><term>Experimental study</term><term>Fabrication property relation</term><term>Microstructure</term><term>Multiple layer</term><term>Oxide ceramics</term><term>Oxygen pressure</term><term>Partial pressure</term><term>Pressure effect</term><term>Transmission electron microscopy</term><term>X ray spectrometry</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Etude expérimentale</term><term>Céramique oxyde</term><term>Céramique électronique</term><term>Baryum titanate</term><term>Condensateur céramique</term><term>Condensateur électrochimique</term><term>Multicouche</term><term>Effet pression</term><term>Pression partielle</term><term>Pression oxygène</term><term>Propriété électrique</term><term>Propriété diélectrique</term><term>Microstructure</term><term>Relation fabrication propriété</term><term>Microscopie électronique transmission</term><term>Spectrométrie RX</term><term>Spectrométrie dispersive</term><term>BaTiO3</term><term>Ba O Ti</term><term>8247U</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The dielectric properties, dopant distributions, and microstructures of BaTiO<sub>3</sub>-based multilayer ceramic capacitors (MLCCs) sintered in H<sub>2</sub>N<sub>2</sub>-H<sub>2</sub>O atmospheres with P<sub>o2</sub> = 10 7.5 Pa (BMX-7.5) and P<sub>o2</sub> = 10<sup>-9.5</sup> Pa (BMX-9.5) were studied, and the effects of oxygen partial pressures were analyzed. Dielectric measurements showed that BMX-7.5 had a lower dielectric constant at temperatures above 20 C, but a higher dielectric constant at temperatures below 10°C when compared with BMX-9.5. The coexistence of core-shell and core grains was observed in bright field (BF) transmission electron microscopy images in both types of capacitors. Triple-point and grain boundary phases were observed more frequently in BMX-9.5 than in BMX-7.5, and energy-dispersive X-ray spectrometer point-by-point analysis revealed that these second phases contained high concentrations of dopants such as Si, Y, and Ca. The dopant concentration in the shell regions in BMX-7.5 was higher than that in similar regions in BMX-9.5. Smeared and twisted grain boundaries with fringes observed in both types of MLCCs indicated that the shell regions in both samples were formed either by diffusion of foreign ions into BaTiO<sub>3</sub> or by crystallization of grain boundary and triple-point liquid phases. It was deduced that the partial pressure of oxygen in the sintering atmosphere influenced the microstructures, dopant distributions, and core-shell ratios of the grains in these materials.</div></front></TEI><affiliations><list><country><li>États-Unis</li></country></list><tree><country name="États-Unis"><noRegion><name sortKey="Qiquan Feng" sort="Qiquan Feng" uniqKey="Qiquan Feng" last="Qiquan Feng">QIQUAN FENG</name></noRegion><name sortKey="Chu, Mike" sort="Chu, Mike" uniqKey="Chu M" first="Mike" last="Chu">Mike Chu</name><name sortKey="Edwards, Doreen D" sort="Edwards, Doreen D" uniqKey="Edwards D" first="Doreen D." last="Edwards">Doreen D. Edwards</name><name sortKey="Mccauley, Daniel E" sort="Mccauley, Daniel E" uniqKey="Mccauley D" first="Daniel E." last="Mccauley">Daniel E. Mccauley</name><name sortKey="Mcconville, Caspar J" sort="Mcconville, Caspar J" uniqKey="Mcconville C" first="Caspar J." last="Mcconville">Caspar J. Mcconville</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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